Toluene AR 200L
9476-09-200L



 
Danger

 

Formula: C6H5CH3
MW: 92,14 g/mol
Boiling Pt: 110,6 °C (1013 hPa)
Melting Pt: –95 °C
Density: 0,867 g/cm³ (20 °C)
Flash Pt: 4 °C
Storage Temperature: Ambient		 MDL Number: MFCD00008512
CAS Number: 108-88-3
EINECS: 203-625-9
UN: 1294
ADR: 3,II
REACH: 05-2114615130-69
Merck Index: 12,09667
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pecification Test Results

 

For Microelectronic Use  
Assay (C6H5CH3) (by GC) ≥ 99.5 %
Color (APHA) ≤ 10
Acidity (µeq/g) ≤ 0.2
Residue after Evaporation ≤ 2.0 ppm
Water (by KF, coulometric) ≤ 0.03 %
Substances Darkened by H2SO4 Passes Test
Su lfur Compounds (as S) ≤ 0.003 %
Chl oride (Cl) ≤ 2 ppm
Phos phate (PO4) ≤ 0.5 ppm
Trace Impurities - Alumin um (Al) ≤ 20 ppb
Arse nic and Antim ony (as As) ≤ 10.0 ppb
Trace Impurities - Ba rium (Ba) ≤ 10.0 ppb
Trace Impurities - Bor on (B) ≤ 20.0 ppb
Trace Impurities - Cadm ium (Cd) ≤ 20.0 ppb
Trace Impurities - Calc ium (Ca) ≤ 100.0 ppb
Trace Impurities - Chro mium (Cr) ≤ 10.0 ppb
Trace Impurities - Co balt (Co) ≤ 20 ppb
Trace Impurities - Cop per (Cu) ≤ 20.0 ppb
Trace Impurities - Galli um (Ga) ≤ 50 ppb
Trace Impurities - Germ anium (Ge) ≤ 50.0 ppb
Trace Impurities - G old (Au) ≤ 20 ppb
Heavy Metals (as Pb) ≤ 500.0 ppb
Trace Impurities - Iro n (Fe) ≤ 20.0 ppb
Trace Impurities - Lith ium (Li) ≤ 20.0 ppb
Trace Impurities - Mag nesium (Mg) ≤ 10.0 ppb
Trace Impurities - Mang anese (Mn) ≤ 10.0 ppb
Trace Impurities - Nic kel (Ni) ≤ 20.0 ppb
Trace Impurities - Pota ssium (K) ≤ 50 ppb
Trace Impurities - Sili con (Si) ≤ 100.0 ppb
Trace Impurities - Sil ver (Ag) ≤ 20.0 ppb
Trace Impurities - Sod ium (Na) ≤ 100.0 ppb
Trace Impurities - Stro ntium (Sr) ≤ 10.0 ppb
Trace Impurities - Ti n (Sn) ≤ 30.0 ppb
Trace Impurities - Zi nc (Zn) ≤ 20.0 ppb

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